SIMS: Basic Principles and Components

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4.8 (50 件の評価)
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AS

May 19, 2020

It was very informative and I am happy to competed this wonderful course. Very point to point effort done by Coursera and MEPhI.

HD

May 26, 2020

This course covers a lot of important topics really well. The analysis part is explained in a great way.

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Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

講師

  • Sadovsky Yaroslav

    Sadovsky Yaroslav

    Assistant

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