SIMS: Basic Principles and Components

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4.8 (81 件の評価)
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AS

May 19, 2020

It was very informative and I am happy to competed this wonderful course. Very point to point effort done by Coursera and MEPhI.

CL

Jul 11, 2020

As a researcher, this course helped a lot in identifying which surface analysis should be appropriately used.

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Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

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  • Sadovsky Yaroslav

    Sadovsky Yaroslav

    Assistant

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